RF-VNA / RF - Vector Network Analysis

To characterise the response of a system in high frequency (up to GHz range), a Vector network analyser is typically used. The system will apply a known electrical stimuli of specific frequency and measure the reflected / absorbed voltage and phase. The resulting measurement presents a detailed electrical characterization of the system in terms of equivalent impedance of material under test as a function of frequency throughout the measured frequency range. This s commonly used to measure high frequency devices as well as measure the material properties in extended frequency ranges.

Tool

Custom system 0.001 Hz – 4MHz (lock-in)

Method

Electrical impedance spectroscopy

Environment

Clean Room ISO-7 (Class 10000)

Frequency Range

0.001 Hz – 4MHz

Port Number

1 port

Available Ports

BNC and / or Liquid cell for liquid sample measurements

Applied Stimuli

1nVolt - 1mVolt

DC Biasing Potential

Yes (limited by leakage currents)

Other Related Tools

Automated measurement system

Additional Information

Dr. George Deligeorgis, deligeo@iesl.forth.gr

Tool

Anritsu MS4644B 40 GHz VectorStar VNA on wafer probe station (sample size: From 0.5” to 4” wafer)

Method

RF – Vector network analysis

Environment

Clean Room ISO-7 (Class 10000)

Frequency Range

10 MHz – 40 GHz

Port Number

2 ports

Applied Stimuli

-20dBm to +10dBm programmable

DC Biasing Potential

Yes (up to 40 Volts, 0.3 A)

Available Ports

GSG 200um, GSG 150um, material probes upon discussion

Other Related Tools

Noise figure attachment, power dependency measurement

Additional Information

George Deligeorgis, deligeo@physics.uoc.gr

Tool

HP8510B

Method

RF – Vector network analysis

Environment

Clean Room ISO-7 (Class 10000)

Frequency Range

100 MHz – 20 GHz

Port Number

2 ports

Available Ports

SMA and/or N-type upon agreement available

Applied Stimuli

-10 – 0 dBm

DC Biasing Potential

Yes (up to 40Volts, 0.3 A)

Other Related Tools

Automated cycling measurement for reliability

Additional Information

George Deligeorgis, deligeo@physics.uoc.gr

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