RF-VNA / RF - Vector Network Analysis
To characterise the response of a system in high frequency (up to GHz range), a Vector network analyser is typically used. The system will apply a known electrical stimuli of specific frequency and measure the reflected / absorbed voltage and phase. The resulting measurement presents a detailed electrical characterization of the system in terms of equivalent impedance of material under test as a function of frequency throughout the measured frequency range. This s commonly used to measure high frequency devices as well as measure the material properties in extended frequency ranges.
Anritsu MS4644B 40 GHz VectorStar VNA on wafer probe station (sample size: From 0.5” to 4” wafer)
RF – Vector network analysis
Clean Room ISO-7 (Class 10000)
10 MHz – 40 GHz
2 ports
-20dBm to +10dBm programmable
Yes (up to 40 Volts, 0.3 A)
GSG 200um, GSG 150um, material probes upon discussion
Noise figure attachment, power dependency measurement
George Deligeorgis, deligeo@physics.uoc.gr
HP8510B
RF – Vector network analysis
Clean Room ISO-7 (Class 10000)
100 MHz – 20 GHz
2 ports
SMA and/or N-type upon agreement available
-10 – 0 dBm
Yes (up to 40Volts, 0.3 A)
Automated cycling measurement for reliability
George Deligeorgis, deligeo@physics.uoc.gr
Custom system 0.001 Hz – 4MHz (lock-in)
Electrical impedance spectroscopy
Clean Room ISO-7 (Class 10000)
0.001 Hz – 4MHz
1 port
BNC and / or Liquid cell for liquid sample measurements
1nVolt - 1mVolt
Yes (limited by leakage currents)
Automated measurement system
Dr. George Deligeorgis, deligeo@iesl.forth.gr
