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Facility
Characterization
Micro-nanofabrication
Synthesis & Growth
Theory & Simulation
Facility Tools
AC-DC Transfer / AC-DC Voltage & Current Transfer
ADS-S / Automatic Dicing Saw - Scribing
AFM /Atomic Force Microscopy
ALD / Atomic Layer Deposition
C-NANO / Carbon-based nanostructures and hybrid material synthesis
CPMCM / Characterization of Porous materials/ Catalysts/Membranes
CVD / Chemical Vapor Deposition
DC - AC MM / DC – AC Magnetic Measurements
DC-AC Meas / DC-AC Electrical Measurements
DCV-Josephson / Primary Josephson Voltage Standard
DSC / Differential Scanning Calorimetry
EBL / Electron Beam Lithography
EBME / E-beam Metal Evaporation
Energetic Stability, Growth Kinetics & Thermodynamic Properties
EP / Electroplating
EPR / Electron Paramagnetic Resonance
FTIR / Fourier-Transform Infrared Spectroscopy
FTP / Furnace Thermal Processing
GC-LC MS/Gas and Liquid Chromatography-Mass Spectrometry
Ground state structural, electronic, optical & magnetic properties
HR-LS-NMR / High-Resolution Liquid-Sate Nuclear Magnetic Resonance
HT Furnace / High temperature furnace
ICPE / Inductively Coupled Plasma Etching
II / Ion Implantation
III-Nitrides & Arsenides MBE / III-Nitrides & Arsenides Molecular Beam Epitaxy
LAGS / Laser Assisted Graphene Synthesis
LFA / Laser Flash Analysis for thermal diffusivity measurements
LP / Laser Processing
MN-FD / Metallic Nanoparticle Fabrication & Deposition in Vacuum
MS/Mössbauer Spectroscopy
Optical / Reflectance Photometry & Solar Cell Characterization
PL / Steady-State & Time-Resolved Photoluminescence Spectroscopy
PLD / Pulsed Laser Deposition
PLG / Photolithography
PLP / Precision Lapping & Polishing
Profilometry / Surface Stylus Profilometry
PS -PHMS/ Polymer and Polymer based Hybrid Material Synthesis
Raman / Raman Spectroscopy & Microscopy
REDOX / Electrochemistry & Electrocatalysis
RF-S / Radio-Frequency Sputtering
RF-VNA / RF - Vector Network Analysis
RIE / Reactive Ion Etching
RTP /Rapid Thermal Processing
SCN / Synthesis of Colloidal Nanocrystals
SEC / Size Exclusion Chromatography
SEM /Scanning Electron Microscopy
SLS – DLS / Static and Dynamic Light Scattering
Solvothermal synthesis/ Microwave & Autoclave Reactors
TEM /Transmission Electron Microscopy
TGA / Thermogravimetric Analysis
Time & Frequency NS / Time & Frequency National Standard
Transport Properties of Materials & Nanostructures
VSM/Vibrating Sample Magnetometry
WB / Wire bonding
XPS- UPS-Auger / X-RAY & UV photoelectron spectroscopy, AUGER electron spectroscopy
XRD /X-Ray Diffraction
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